Dr. Alex Volinsky, Assistant Professor

E-mail :volinsky@eng.usf.edu

Website: http://www.eng.usf.edu/~volinsky

Telephone: 813-974-5658

Location: ENC 2214

Education

Ph.D. University of Minnesota, 2000, Materials Science and Engineering.

M.S.  Moscow State University of Aviation Technology (MATI),

        1996, Metallurgical Engineering.

Research Interests

Thin films processing, mechanical properties and characterization. 

Adhesion and fracture of thin films. Nanoindentation. 

Irradiated materials properties and X-Ray diffraction.

Adhesion Measurements of Thin Films in Corrosive Environments

It is well known that corrosive environments cause coating degradation and adhesion loss. The project is to quantify and study thin film adhesion in liquid environments. It involves developing novel fluid-compatible nanoindentation techniques for thin film adhesion measurements.  In addition to developing quantifiable adhesion test, we demonstrated that the addition of water at the film/substrate interface reduces adhesion by two orders of magnitude.

Funding: NACE International, The Corrosion Society; Seagate Technology

Principal Investigator: Alex Volinsky